T. Dellorto et al., LATERALLY RESOLVED MEASUREMENTS OF CESIUM IODIDE QUANTUM YIELD, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2787-2790
Citations number
36
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Spatially resolved x-ray secondary electron photoemission spectra reve
aled lateral changes in quantum efficiency and chemical composition of
polycrystalline cesium iodide photodetectors. Such changes depend on
the substrate (stainless steel or aluminum). These results emphasize t
he limitations of conventional, spatially integrated quantum efficienc
y measurements, and shed new light on the chemical properties of inhom
ogeneous polycrystalline cesium iodide. (C) 1995 American Vacuum Socie
ty.