LATERALLY RESOLVED MEASUREMENTS OF CESIUM IODIDE QUANTUM YIELD

Citation
T. Dellorto et al., LATERALLY RESOLVED MEASUREMENTS OF CESIUM IODIDE QUANTUM YIELD, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2787-2790
Citations number
36
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
13
Issue
6
Year of publication
1995
Pages
2787 - 2790
Database
ISI
SICI code
0734-2101(1995)13:6<2787:LRMOCI>2.0.ZU;2-R
Abstract
Spatially resolved x-ray secondary electron photoemission spectra reve aled lateral changes in quantum efficiency and chemical composition of polycrystalline cesium iodide photodetectors. Such changes depend on the substrate (stainless steel or aluminum). These results emphasize t he limitations of conventional, spatially integrated quantum efficienc y measurements, and shed new light on the chemical properties of inhom ogeneous polycrystalline cesium iodide. (C) 1995 American Vacuum Socie ty.