SYNTHESIS AND CHARACTERIZATION OF FLASH-EVAPORATED MOO3 THIN-FILMS

Molybdenum trioxide with an orthorhombic symmetry is one of the most i nteresting layered intercalation materials because of its use in solid state batteries and display systems. In the present investigation, th in films of MoO3 were prepared by flash-evaporation technique on silic a glass and silicon substrates maintained at different temperatures, T -s, in the range of 30-300 degrees C. The films were systematically ch aracterized by studying their structural, optical and electrical prope rties. X-ray diffraction and SEM analysis showed that films have an or thorhombic layered structure. The Raman scattering and infrared absorp tion were studied to establish the T-s dependence of the film properti es. The energy gap of MoO3 films is located between 2.8 and 3.2 eV dep ending on the substrate and annealing temperature. AC and DC conductiv ities were measured as a function of T-s. The effect of annealing trea tment was also investigated.