SIMULATION OF TEM IMAGES CONSIDERING PHONON AND ELECTRONIC EXCITATIONS

Authors
DINGES C BERGER A ROSE H
Citation
C. Dinges et al., SIMULATION OF TEM IMAGES CONSIDERING PHONON AND ELECTRONIC EXCITATIONS, Ultramicroscopy, 60(1), 1995, pp. 49-70
Citations number
27
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
60
Issue
1
Year of publication
1995
Pages
49 - 70
Database
ISI
SICI code
0304-3991(1995)60:1<49:SOTICP>2.0.ZU;2-3
Abstract
An improved image simulation procedure has been developed which takes into account elastic, inelastic and phonon scattering. The program all ows the simulation of energy-filtered and unfiltered images of arbitra ry objects. As typical examples diffraction patterns of thick crystall ine specimens including phonon scattering, total scattering cross sect ions and filtered inelastic images of a small biological specimen are calculated and discussed.