Si. Yoo et al., MELT PROCESSING FOR STRONG FLUX-PINNING IN RE-BA-CU-O (RE ND,SM,EU,GD) SUPERCONDUCTORS, Journal of electronic materials, 24(12), 1995, pp. 1923-1930
Factors affecting a characteristic flux pinning in light rare earth (R
E)-Ba-Cu-O (RE: Nd, Sm, Eu, Gd) superconductors fabricated by the oxyg
en-controlled-melt-growth (OCMG) process have been investigated throug
h a comparative study. At 77K and for the applied field parallel to th
e c-axis of the sample (H//c), the flux pinning of all OCMG-processed
REBa(2)Cu(3)O(y) (RE 123) samples studied was very sensitive to the ox
ygen partial pressure (P-O2) controlled during the melt growth and thu
s, with lowering P-O2, the peak field (B-pk) in the M-H loops shifted
to a high field and the irreversibility line (IL) shifted to a high H-
T region. For a Nd123 sample, as the oxygen annealing temperature incr
eased above 300 degrees C, both B-pk and IL were systematically depres
sed. However, B-pk for all systems was insensitive to the amount of th
e second phase (Nd4Ba2Cu2O10 (Nd422) and RE(2)BaCuO(5) (RE211) for the
other) inclusion in the superconducting RE123 matrix, supporting that
the characteristic flux pinning is due to the superconducting matrix.