Js. Hamel, SIMPLIFIED ANALYTICAL QUASI-TRANSPARENT SOLUTION FOR MINORITY-CARRIERTRANSPORT IN NONUNIFORMLY DOPED QUASI-NEUTRAL SEMICONDUCTOR REGIONS, I.E.E.E. transactions on electron devices, 43(1), 1996, pp. 104-109
A simple analytical solution, which retains a general dependence of tr
ansport parameters on impurity concentration, is presented for minorit
y carrier transport, ia nonuniformly doped semiconductor quasineutral
regions, The new solution exhibits improved accuracy for high surface
recombination velocities over all previous solutions of the same degre
e of analytic complexity which retain a general dependence of the tran
sport parameters on impurity concentration, while retaining the same d
egree of accuracy for low surface recombination velocities as the most
accurate of these previous solutions, The proposed solution exhibits
accuracy comparable to significantly more complex third order expressi
ons which are derived by three iterations using the systematic approac
h of Park ct al, [I].