D. Manno et S. Mongelli, CONVERGENT-BEAM ELECTRON-DIFFRACTION ANALYSIS OF STRAIN IN MULTILAYERSTRUCTURES - A KINEMATICAL APPROACH, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 457-463
Convergent beam electron diffraction (CBED) performed on plan-view sam
ples has been considered in order to analyse strained superlattices. T
he composition modulation along the growth axis of multilayer material
s and the strain modulation at the interfaces give rise to special fea
tures in higher order Laue zone (HOLZ) reflections. A simple model bas
ed on the expansion-contraction of the lattice spacing in each layer a
long the growth direction is proposed to simulate rocking curves in th
e kinematical approximation. Applications to CdxZn1-xSe/ZnSe superlatt
ices are discussed.