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Results: 1-25/282
Authors:
ANTOGNOZZI M
SENTIMENTI A
VALDRE U
Citation: M. Antognozzi et al., FABRICATION OF NANO-TIPS BY CARBON CONTAMINATION IN A SCANNING ELECTRON-MICROSCOPE FOR USE IN SCANNING PROBE MICROSCOPY AND FIELD-EMISSION, Microscopy microanalysis microstructures, 8(6), 1997, pp. 355-368
Authors:
AITOUCHEN A
KIHN Y
ZANCHI G
Citation: A. Aitouchen et al., QUANTITATIVE EELS BY SPECTRUM PARAMETRIZATION, Microscopy microanalysis microstructures, 8(6), 1997, pp. 369-378
Authors:
GIORGIO S
HENRY C
Citation: S. Giorgio et C. Henry, BIMETALLIC PDCU AND PDCU3 PARTICLES PREPARED BY WET IMPREGNATION-HRTEM - STUDY OF THE STRUCTURE AND THE INTERFACE WITH THE MGO SUBSTRATE, Microscopy microanalysis microstructures, 8(6), 1997, pp. 379-391
Authors:
TROYON M
LEI HN
WANG ZH
SHANG GY
Citation: M. Troyon et al., A SCANNING FORCE MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE FOR MULTIDIMENSIONAL DATA-ANALYSIS, Microscopy microanalysis microstructures, 8(6), 1997, pp. 393-402
Authors:
PAL U
KOSHIZAKI N
TERAUCHI S
SASAKI T
Citation: U. Pal et al., ELECTRON-BEAM-INDUCED STRUCTURAL MODIFICATION OF THE OXIDIZED SILICONMICRO-CLUSTERS IN ZNO MATRIX, Microscopy microanalysis microstructures, 8(6), 1997, pp. 403-411
Authors:
FABRE A
BARRALLIER L
TORREGROSA F
ROUX L
Citation: A. Fabre et al., ION-BEAM IMPLANTATION AND PLASMA IMMERSION ION-IMPLANTATION - APPLICATION ON NITRIDED TI-6AL-4V TITANIUM-ALLOY, Microscopy microanalysis microstructures, 8(6), 1997, pp. 413-422
Authors:
DAVID D
Citation: D. David, INTERFACES AND MULTI-MATERIALS, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 3-3
Authors:
BARRALLIER L
CHARAI A
THOMAS O
Citation: L. Barrallier et al., INTERFACES AND MULTI-MATERIALS - FOREWORD, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 5-5
Authors:
MULLER P
KERN R
Citation: P. Muller et R. Kern, SOME ASPECTS OF COHERENT EPITAXIAL DEPOSITS, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 229-238
Authors:
NGUYMARECHAL K
MENELLE A
GERGAUD P
ALUSTA K
Citation: K. Nguymarechal et al., STRESS EVOLUTION UNDER NEUTRON-IRRADIATION OF NIC TI SUPERMIRRORS/, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 239-249
Authors:
MAHODAUX C
RIGNEAULT H
GIOVANNINI H
ESCOUBAS L
MORRETI P
Citation: C. Mahodaux et al., MECHANICAL-PROPERTIES OF OPTICAL DIELECTRIC THIN-FILMS DEPOSITED BY THE ION PLATING TECHNIQUE, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 251-260
Authors:
BOSSEBOEUF A
DUPEUX M
BOUTRY M
BOUROUINA T
BOUCHIER D
DEBARRE D
Citation: A. Bosseboeuf et al., CHARACTERIZATION OF W FILMS ON SI AND SIO2 SI SUBSTRATES BY X-RAY-DIFFRACTION, AFM AND BLISTER TEST ADHESION MEASUREMENTS/, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 261-272
Authors:
DUPEUX M
PERDEREAU M
Citation: M. Dupeux et M. Perdereau, SIMS PROFILING OF METALLIC MULTILAYERS CO CU/CO - EFFECTS OF BOMBARDMENT PARAMETERS ON DEPTH RESOLUTION/, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 273-286
Authors:
HOMBOURGER C
JONNARD P
BONNELLE C
BEAUPREZ E
SPIRCKEL M
FELTZ B
BOUTARD D
GALLIEN JP
Citation: C. Hombourger et al., DEPTH PROFILES OF AL MN SI MULTILAYERS, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 287-300
Authors:
BASILE F
BERGNER J
BOMBART C
NALLET P
CHASSAING E
LORANG G
Citation: F. Basile et al., QUANTIFICATION OF AES DEPTH SPUTTER PROFI LING - CHARACTERIZATION OF CU-CO MULTILAYERS INTERFACES, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 301-314
Authors:
VIGIER P
IACOB C
DAVID D
Citation: P. Vigier et al., NUCLEAR MICROANALYSIS OF NITRIDED STEELS, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 315-323
Authors:
JONNARD P
HOMBOURGER C
VERGAND F
BONNELLE C
RENOU A
ASSABAN A
GILLET E
GILLET M
Citation: P. Jonnard et al., PHYSICOCHEMICAL INTERACTION AND ATOMIC-STRUCTURE AT CU-MGO INTERFACES, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 325-334
Authors:
LOCQUET JN
SOTO R
BARRALLIER L
CHARAI A
Citation: Jn. Locquet et al., COMPLETE TEM INVESTIGATION OF A NITRIDED LAYER FOR A CR ALLOY-STEEL, Microscopy microanalysis microstructures, 8(4-5), 1997, pp. 335-352
Authors:
COLLIEX C
Citation: C. Colliex, TOWARDS THE MERGING OF MICROSCOPY-MICROANALYSIS-MICROSTRUCTURES INTO THE EUROPEAN-PHYSICAL-JOURNAL-APPLIED-PHYSICS, Microscopy microanalysis microstructures, 8(3), 1997, pp. 3-4
Authors:
POLIZZI S
ARMIGLIATO A
RIELLO P
BORRELLI NF
FAGHERAZZI G
Citation: S. Polizzi et al., REDRAWN PHASE-SEPARATED BOROSILICATE GLASSES - A TEM INVESTIGATION, Microscopy microanalysis microstructures, 8(3), 1997, pp. 157-165
Authors:
AUFRAY B
GOTHELID M
GAY JM
MOTTET C
LANDEMARK E
FALKENBERG G
LOTTERMOSER L
SEEHOFER L
JOHNSON RL
Citation: B. Aufray et al., AG CU(111) - AN INCOMMENSURATE RECONSTRUCTION STUDIED WITH SCANNING-TUNNELING-MICROSCOPY AND SURFACE X-RAY-DIFFRACTION/, Microscopy microanalysis microstructures, 8(3), 1997, pp. 167-174
Authors:
REYNAUDLAPORTE I
VAYER M
KAUFFMANN JP
ERRE R
Citation: I. Reynaudlaporte et al., AN ELECTROCHEMICAL-AFM STUDY OF THE INITIATION OF THE PITTING OF A MARTENSITIC STAINLESS-STEEL, Microscopy microanalysis microstructures, 8(3), 1997, pp. 175-185
Authors:
MORNIROLI JP
CORDIER P
VANCAPPELLEN E
ZUO JM
SPENCE J
Citation: Jp. Morniroli et al., APPLICATION OF THE CONVERGENT-BEAM IMAGING (CBIM) TECHNIQUE TO THE ANALYSIS OF CRYSTAL DEFECTS, Microscopy microanalysis microstructures, 8(3), 1997, pp. 187-202
Authors:
LEGRANVALETMANCINI M
MARIE AM
ROUCAU C
CALDES M
BROHAN L
Citation: M. Legranvaletmancini et al., X-RAY, ELECTRON-DIFFRACTION AND HREM STUDIES OF KHTI4O9, XH(2)O THERMOLYSIS - CHARACTERIZATION OF K4TI16O34, Microscopy microanalysis microstructures, 8(3), 1997, pp. 203-225
Authors:
HAWKES P
Citation: P. Hawkes, 100 YEARS OF THE ELECTRON, Microscopy microanalysis microstructures, 8(2), 1997, pp. 5-7