APPLICATION OF THE CONVERGENT-BEAM IMAGING (CBIM) TECHNIQUE TO THE ANALYSIS OF CRYSTAL DEFECTS

Authors
MORNIROLI JP CORDIER P VANCAPPELLEN E ZUO JM SPENCE J
Citation
Jp. Morniroli et al., APPLICATION OF THE CONVERGENT-BEAM IMAGING (CBIM) TECHNIQUE TO THE ANALYSIS OF CRYSTAL DEFECTS, Microscopy microanalysis microstructures, 8(3), 1997, pp. 187-202
Citations number
16
Journal title
Microscopy microanalysis microstructures → ACNP
ISSN journal
11542799
Volume
8
Issue
3
Year of publication
1997
Pages
187 - 202
Database
ISI
SICI code
1154-2799(1997)8:3<187:AOTCI(>2.0.ZU;2-U
Abstract
It is shown how the technique of Convergent Beam IMaging (CBIM), propo sed by Humpreys et al. in 1988, can be useful for the analysis of crys tal defects such as dislocations in Garnet. It is also shown how the o riginal technique can be greatly improved by using an objective apertu re, a very small spot size and an energy filter. With these experiment al conditions, the quality of the CBIM patterns is nearly as good as t he quality of LACBED patterns, with which they are compared.