INTERPRETATION OF HOLOGRAPHIC CONTOUR MAPS OF REVERSE-BIASED P-N-JUNCTIONS

Reverse-biased p-n junctions have been observed by means of electron h olography using a transmission electron microscope equipped with an el ectron biprism and a field emission gun. Aim of this work is to presen t and discuss an analytical model for the electric field associated to a periodic array of alternating p and n stripes lying in a half-plane which simulates the experimental setup and allows the interpretation of the main features of the observed holograms and the quantitative ev aluation of the effect of the fringing field on the holograms and on t he reconstructed images.