NANOCRYSTALLINE AL INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPE

Citation
M. Re et al., NANOCRYSTALLINE AL INVESTIGATED BY TRANSMISSION ELECTRON-MICROSCOPE, Microscopy microanalysis microstructures, 6(5-6), 1995, pp. 673-683
Citations number
13
Categorie Soggetti
Spectroscopy,Microscopy
ISSN journal
11542799
Volume
6
Issue
5-6
Year of publication
1995
Pages
673 - 683
Database
ISI
SICI code
1154-2799(1995)6:5-6<673:NAIBTE>2.0.ZU;2-I
Abstract
Nanocrystalline aluminium (n-Al), prepared by mechanical attrition in an inert atmosphere and in form of cold consolidated bars, has been in vestigated by transmission electron microscopy. The effects of three f inal thinning techniques of preparation for TEM, ion-milling, electroc hemical jet-polishing and ''powders'', have been compared. The most re presentative samples prove to be those prepared by putting some powder on a carbon film coated grid. Information about the grain sizes for s amples prepared by the different techniques and samples before and aft er a thermal treatment (500 K) has been obtained. We have also reporte d our high-resolution images of interfaces.