TERMINAL RELIABILITY USING BINARY DECISION DIAGRAMS

Authors
SINGH H VAITHILINGAM S ANNE RK ANNEBERG L
Citation
H. Singh et al., TERMINAL RELIABILITY USING BINARY DECISION DIAGRAMS, Microelectronics and reliability, 36(3), 1996, pp. 363-365
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
36
Issue
3
Year of publication
1996
Pages
363 - 365
Database
ISI
SICI code
0026-2714(1996)36:3<363:TRUBDD>2.0.ZU;2-#
Abstract
Terminal reliability has been a topic of research for the last three d ecades. Several techniques for determining terminal reliability are av ailable in literature. Binary decision diagrams have attracted the att ention of several digital logic research workers. The objective of thi s paper is to illustrate how binary decision diagrams can be exploited for determining terminal reliability of networks.