Ml. Yu et al., IMPROVED EMISSION STABILITY OF CARBURIZED HFC[100] AND ULTRASHARP TUNGSTEN FIELD EMITTERS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2436-2440
We have evaluated the cold-field-emission characteristics of HfC(100)
and ultrasharp tungsten emitters. We found that proper acetylene treat
ment improved both the angular current confinement and the emission st
ability of thermally cleaned HfC(100) tips. Stable emission exceeding
10 mu A/sr for over 1 h and angular confinement to a 3 degrees semicon
e angle have been observed, The improvements are probably related to t
he modified work function and surface chemical composition induced by
the acetylene treatment at the tip apex, Carburization of W(100) acid
W(111) tips also significantly improved the emission current stability
. This study indicates the usefulness of surface processing in the dev
elopment of cold-field emitters. (C) 1995 American Vacuum Society.