A. Muray et al., EXPERIMENTAL EVALUATION OF AN ELECTRON-BEAM PULSE-MODULATED BLANKER (160 MHZ) FOR NEXT-GENERATION ELECTRON-BEAM RASTER SCAN SYSTEMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 2488-2492
The simplicity of raster scan architecture has several benefits for ma
sk-making production tools, the most important being accuracy. Neverth
eless, building patterns on a grid resolution determined by the writin
g address of the raster scan mask generator places limitations on patt
ern edge locations, or equivalently, on throughput A method of getting
around this throughput bottleneck is pixel-level dose modulation, i.e
., graybeam. In this article, a new driver technology in combination w
ith the MEBES (R) 4500 blanker operating at 160 MHz is experimentally
evaluated for real-time dose modulation by pulse width variation. Meas
urements of the rise and fall time of the blanker driver using various
input data vectors (i.e., combinations of various pulse width signals
) and a beam current modulation transfer function for the blanker are
presented. Contributions from electronic artifacts such as electronic
jitter are measured. Finally, these measurement results are used to de
termine the preliminary performance of a graybeam system. (C) 1995 Ame
rican Vacuum Society.