THE INFLUENCE OF CYLINDRICAL GEOMETRY ON X-RAY STRESS TENSOR ANALYSIS.1. GENERAL FORMULATION

Citation
M. Francois et al., THE INFLUENCE OF CYLINDRICAL GEOMETRY ON X-RAY STRESS TENSOR ANALYSIS.1. GENERAL FORMULATION, Journal of applied crystallography, 28, 1995, pp. 761-767
Citations number
16
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
28
Year of publication
1995
Part
6
Pages
761 - 767
Database
ISI
SICI code
0021-8898(1995)28:<761:TIOCGO>2.0.ZU;2-#
Abstract
Stress analysis by X-ray diffraction, usually performed on a specimen with plane geometry, becomes very difficult on more complex surfaces. A model is proposed to calculate the six independent components of the stress tensor for cylindrical symmetry. The mathematical approach des cribed highlights two distinct effects that modify values of measured strain by X-ray diffraction, a rotation effect and a translation effec t. The X-ray absorption by the material is taken into consideration an d two models are proposed to undertake the mathematical processing on thick materials and thin layers. It is equally possible to take into a ccount, for example, crystallographic texture and experimental feature s as phi psi oscillations., Examples and applications will be given in paper II [Dionnet, Francois, Sprauel & Nardou (1995). In preparation] .