M. Francois et al., THE INFLUENCE OF CYLINDRICAL GEOMETRY ON X-RAY STRESS TENSOR ANALYSIS.1. GENERAL FORMULATION, Journal of applied crystallography, 28, 1995, pp. 761-767
Stress analysis by X-ray diffraction, usually performed on a specimen
with plane geometry, becomes very difficult on more complex surfaces.
A model is proposed to calculate the six independent components of the
stress tensor for cylindrical symmetry. The mathematical approach des
cribed highlights two distinct effects that modify values of measured
strain by X-ray diffraction, a rotation effect and a translation effec
t. The X-ray absorption by the material is taken into consideration an
d two models are proposed to undertake the mathematical processing on
thick materials and thin layers. It is equally possible to take into a
ccount, for example, crystallographic texture and experimental feature
s as phi psi oscillations., Examples and applications will be given in
paper II [Dionnet, Francois, Sprauel & Nardou (1995). In preparation]
.