P. Aubert et al., EPITAXIAL-GROWTH OF LINBO3 THIN-FILMS ON (001)SAPPHIRE BY PULSED-LASER DEPOSITION, Microelectronic engineering, 29(1-4), 1995, pp. 107-110
LiNbO3 thin films have been deposited on c-cut single crystalline sapp
hire substrates (alpha-Al2O3) by the pulsed laser deposition technique
. Crystalline quality and structural properties have been determined u
sing Rutherford backscattering spectroscopy (RES) and x-ray diffractio
n experiments. Under optimised conditions, the (001) epitaxial growth
has been obtained with some grain misorientations in the plane and an
average surface roughness of about 2 nm as measured by atomic force mi
croscopy (AFM).