ELECTRODE INVESTIGATION AND ELECTRICAL-PROPERTIES OF RF MAGNETRON-SPUTTERED PB(ZR,TI)O-3

Citation
Be. Kim et al., ELECTRODE INVESTIGATION AND ELECTRICAL-PROPERTIES OF RF MAGNETRON-SPUTTERED PB(ZR,TI)O-3, Microelectronic engineering, 29(1-4), 1995, pp. 231-234
Citations number
4
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
29
Issue
1-4
Year of publication
1995
Pages
231 - 234
Database
ISI
SICI code
0167-9317(1995)29:1-4<231:EIAEOR>2.0.ZU;2-M
Abstract
The platinum is one of the few metals very often employed for contacti ng high permittivity materials. In this paper, we focused our attentio n on the growth, the microstructure and the electrical behaviour of Pt thin films deposited by RF magnetron sputtering on the TiN/Ti/BPSG/Si structure. It is found that 0.5 Pa and 450 degrees C are the best con ditions to obtain a Pt film with low resistivity (10 mu Omega.cm), goo d density (21 g/cm(3)) and a strong texture (111). PZT thin films depo sited by RF magnetron sputtering on such electrode and annealed at 700 degrees C during 30 secondes in O-2 ambient present the desired perov skite structure and promising electrical properties (Ps=50 mu C/cm(2), Pr=33 mu C/cm(2)) at 5V.