L. Ryen et al., TRANSMISSION ELECTRON-MICROSCOPY OF EPITAXIAL SRTIO3 FILMS ON LAALO3 SUBSTRATES, Microelectronic engineering, 29(1-4), 1995, pp. 309-312
Three different epitaxial (001) SrTiO3 films deposited on (110)(rhombo
hedral) LaAlO3 substrates by rf sputtering, have been characterised us
ing transmission electron microscopy (TEM). The films exhibited differ
ent columnar subgrain morphologies with column widths ranging from 7 t
o 19 nm. Slow cooling in an O-2 ambient and in situ annealing at eleva
ted temperature improved the films dielectric tunability and this coul
d be correlated to more narrow column dimensions.