E. Dogheche et al., DETERMINATION OF OPTICAL-PROPERTIES OF LEAD-BASED FERROELECTRICS THIN-FILMS FOR INTEGRATED-OPTICS APPLICATIONS, Microelectronic engineering, 29(1-4), 1995, pp. 315-318
Optical properties of lanthanum doped lead titanate PbLaTiO3-PLT thin
films deposited using the R.F. magnetron sputtering technique have bee
n studied. Polycrystalline films were deposited on sapphire substrates
. All films exibited a dependance of annealing temperature on the key
optical constants. The microstructure of the films and its relation to
the optical properties is observed. Optical waveguiding measurements
at lambda=633 nm wavelength have been investigated.