DETERMINATION OF OPTICAL-PROPERTIES OF LEAD-BASED FERROELECTRICS THIN-FILMS FOR INTEGRATED-OPTICS APPLICATIONS

Citation
E. Dogheche et al., DETERMINATION OF OPTICAL-PROPERTIES OF LEAD-BASED FERROELECTRICS THIN-FILMS FOR INTEGRATED-OPTICS APPLICATIONS, Microelectronic engineering, 29(1-4), 1995, pp. 315-318
Citations number
19
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
29
Issue
1-4
Year of publication
1995
Pages
315 - 318
Database
ISI
SICI code
0167-9317(1995)29:1-4<315:DOOOLF>2.0.ZU;2-1
Abstract
Optical properties of lanthanum doped lead titanate PbLaTiO3-PLT thin films deposited using the R.F. magnetron sputtering technique have bee n studied. Polycrystalline films were deposited on sapphire substrates . All films exibited a dependance of annealing temperature on the key optical constants. The microstructure of the films and its relation to the optical properties is observed. Optical waveguiding measurements at lambda=633 nm wavelength have been investigated.