T. Nakano et al., ION VELOCITY DISTRIBUTIONS IN HELICON WAVE PLASMAS - MAGNETIC-FIELD AND PRESSURE EFFECTS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2046-2056
Consideration of ion transport in high density, low pressure plasma sy
stems is important for meeting process requirements in the manufacturi
ng of ultra-large-scale integrated circuits. The ion energy and angula
r distributions at the boundary between the plasma and the wafer, the
sheath, influence etching selectivity, linewidth control, plasma-induc
ed damage, and microscopic etching uniformity. These distributions, in
turn, are easily altered by changing the magnetic field profile and/o
r the neutral gas pressure. Using Doppler-shifted laser-induced fluore
scence, metastable ion velocity distribution functions in helicon-wave
-excited Ar plasmas are measured. Two magnetic field configurations ar
e examined. For a magnetic ''mirror,'' where the field exhibits a maxi
mum and a saddle point in the source, the plasma is observed to be asy
mmetric and nonuniform: this leads to broadened velocity distributions
and significant ion drift from one region of the plasma to another. A
s the pressure is increased in the mirror field configuration, the tra
nsverse ion ''temperature'' exhibits a maximum as a function of pressu
re and, when etching is ion-flux limited, either decreasing or increas
ing the pressure should result in improved linewidth control. The plas
ma is more symmetric when the magnetic field is reversed in the source
and again downstream. With this double cusp configuration, the transv
erse ion temperature decreases monotonically with pressure, and improv
ed linewidth control in the ion-flux limit would be obtained by operat
ing at higher pressure.