Dm. Tennant et al., MULTIWAVELENGTH DISTRIBUTED-BRAGG-REFLECTOR LASER ARRAY FABRICATED USING NEAR-FIELD HOLOGRAPHIC PRINTING WITH AN ELECTRON-BEAM GENERATED PHASE GRATING MASK, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2509-2513
We describe near optimum near field holography grating masks patterned
by e-beam lithography and a distributed Bragg reflector (DBR) multiwa
velength laser array fabricated using near field printing with this ma
sk. Grating pitches in the array ranged from 242.861 to 243.750 nm in
0.127 nm steps. Data on the pitch precision and pitch adjustment is pr
esented. Use of a conventional UV source rather than laser illuminatio
n both greatly simplified the printing process and eliminated coherent
artifacts from the printed gratings. Chemically etched InP test grati
ngs are shown to be extremely ''clean'' in appearance and low in edge
roughness. DBR laser arrays designed with 100 GHz frequency separation
were processed using the mask described. The measured frequency separ
ation was 99 GHz which could be further adjusted with a tuning section
of the four-section laser design. Characterization of a similar grati
ng mask containing 16 wavelengths with similar pitch increments is als
o described.