RIDGE-WAVE-GUIDE SIDEWALL-GRATING DISTRIBUTED-FEEDBACK STRUCTURES FABRICATED BY X-RAY-LITHOGRAPHY

Citation
Vv. Wong et al., RIDGE-WAVE-GUIDE SIDEWALL-GRATING DISTRIBUTED-FEEDBACK STRUCTURES FABRICATED BY X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2621-2624
Citations number
17
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
11
Issue
6
Year of publication
1993
Pages
2621 - 2624
Database
ISI
SICI code
1071-1023(1993)11:6<2621:RSDSF>2.0.ZU;2-Y
Abstract
A novel distributed feedback structure has been developed in which the grating is patterned onto the sidewalls of a ridge waveguide. Such a laser structure results in simplified processing in that the grating f abrication is independent of both the materials growth and the guide f ormation. The ridge waveguide is first formed by wet-chemical etching. Then, a poly(methylmethacrylate) grating (LAMBDA = 230 nm) is pattern ed onto this ridge waveguide using x-ray lithography. A Ti/Al etch mas k is lifted-off to serve as a mask for subsequent reactive-ion etching . Gratings with long-range spatial-phase coherence and negligible dist ortion, characteristics which are necessary for accurate control of th e wavelength and bandwidth, are obtained using a holographically gener ated x-ray mask.