Tr. Groves, EFFICIENCY OF ELECTRON-BEAM PROXIMITY EFFECT CORRECTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2746-2753
The trend of increasing pattern data volume, together with decreasing
critical dimensions, causes correction of proximity effect to be conti
nually more time consuming and expensive. A tradeoff exists between sp
eed and accuracy. A given correction method may be judged efficient if
the direct computational overhead needed to achieve a predetermined l
evel of accuracy is small. Some basic principles relating to efficienc
y are derived. An optimal correction algorithm follows naturally from
the analysis. Forward and backward scattering have greatly differing r
anges, and correspondingly differing computational requirements. The t
wo processes are easily separated analytically. Dose correction is use
d to offset backscattering, while edge displacement is used to offset
forward scattering. The only direct computational overhead is the loca
l pattern density. All other necessary parameters are precomputed, and
accessed by memory lookup.