REPAIR OF SOFT-X-RAY OPTICAL-ELEMENTS BY STRIPPING AND REDEPOSITION OF MO SI REFLECTIVE COATINGS/

Citation
K. Early et al., REPAIR OF SOFT-X-RAY OPTICAL-ELEMENTS BY STRIPPING AND REDEPOSITION OF MO SI REFLECTIVE COATINGS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2926-2929
Citations number
11
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
11
Issue
6
Year of publication
1993
Pages
2926 - 2929
Database
ISI
SICI code
1071-1023(1993)11:6<2926:ROSOBS>2.0.ZU;2-B
Abstract
Experiments aimed at recovering soft-x-ray projection lithography mirr ors that have defective reflective coatings by stripping and redeposit ion of Mo/Si multilayers are being reported. Two wet etchants were fou nd that would remove the multilayers from composite glass substrates. One etchant is a solution of potassium ferricyanide and sodium hydroxi de in water; the other is nitric acid with a minute quantity of hydrof luoric acid. Although each of these solutions offers preferential etch selection of the multilayers over the substrate glass, the selectivit ies are insufficient. The result is a surface roughening that lowers t he reflectance from subsequently deposited multilayer coatings to an u nacceptable level. With the addition of a carbon barrier layer between the substrate and the multilayer coating, either etchant can be used to strip the multilayers without damage to the underlying substrate su rface.