K. Early et al., REPAIR OF SOFT-X-RAY OPTICAL-ELEMENTS BY STRIPPING AND REDEPOSITION OF MO SI REFLECTIVE COATINGS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2926-2929
Experiments aimed at recovering soft-x-ray projection lithography mirr
ors that have defective reflective coatings by stripping and redeposit
ion of Mo/Si multilayers are being reported. Two wet etchants were fou
nd that would remove the multilayers from composite glass substrates.
One etchant is a solution of potassium ferricyanide and sodium hydroxi
de in water; the other is nitric acid with a minute quantity of hydrof
luoric acid. Although each of these solutions offers preferential etch
selection of the multilayers over the substrate glass, the selectivit
ies are insufficient. The result is a surface roughening that lowers t
he reflectance from subsequently deposited multilayer coatings to an u
nacceptable level. With the addition of a carbon barrier layer between
the substrate and the multilayer coating, either etchant can be used
to strip the multilayers without damage to the underlying substrate su
rface.