Yh. Shiau et Yc. Cheng, STATIC AND DYNAMIC HYSTERESIS IN DEEP-IMPURITY DOPED N-GAAS UNDER DC BIAS VOLTAGE, Solid-state electronics, 39(2), 1996, pp. 205-210
Non-linear carrier transport properties of deep-impurity doped n-GaAs
at room temperatures are studied with the assumption of spatial homoge
neity. The dynamical behavior of the system can be classified into fou
r distinct classes, depending on the magnitude of the load resistance
R, which is connected in series to the system, along with a d.c. bias
voltage V. Global and local bifurcation schemes around the fixed point
s are studied in detail. The bifurcation features include creation of
a saddle-to-saddle loop via sub-critical Hopf bifurcation, creation an
d destruction of a pair of stable and unstable limit cycles via conden
sation of paths, and oscillatory instability occurring in the positive
conductivity region, etc. When Vis slowly increased from low values a
nd then decreased from high values, the system exhibits static switchi
ng, dynamic hysteresis, or no hysteresis, depending on the magnitude o
f R. We find a case that the system exhibits hysteresis even when the
total current is a single-valued function of V.