STATIC AND DYNAMIC HYSTERESIS IN DEEP-IMPURITY DOPED N-GAAS UNDER DC BIAS VOLTAGE

Authors
Citation
Yh. Shiau et Yc. Cheng, STATIC AND DYNAMIC HYSTERESIS IN DEEP-IMPURITY DOPED N-GAAS UNDER DC BIAS VOLTAGE, Solid-state electronics, 39(2), 1996, pp. 205-210
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
39
Issue
2
Year of publication
1996
Pages
205 - 210
Database
ISI
SICI code
0038-1101(1996)39:2<205:SADHID>2.0.ZU;2-V
Abstract
Non-linear carrier transport properties of deep-impurity doped n-GaAs at room temperatures are studied with the assumption of spatial homoge neity. The dynamical behavior of the system can be classified into fou r distinct classes, depending on the magnitude of the load resistance R, which is connected in series to the system, along with a d.c. bias voltage V. Global and local bifurcation schemes around the fixed point s are studied in detail. The bifurcation features include creation of a saddle-to-saddle loop via sub-critical Hopf bifurcation, creation an d destruction of a pair of stable and unstable limit cycles via conden sation of paths, and oscillatory instability occurring in the positive conductivity region, etc. When Vis slowly increased from low values a nd then decreased from high values, the system exhibits static switchi ng, dynamic hysteresis, or no hysteresis, depending on the magnitude o f R. We find a case that the system exhibits hysteresis even when the total current is a single-valued function of V.