STRUCTURAL-ANALYSIS OF HYDROGENATED CARBON-FILMS OBTAINED BY REACTIVEDIRECT-CURRENT MAGNETRON SPUTTERING

Citation
S. Fujimaki et al., STRUCTURAL-ANALYSIS OF HYDROGENATED CARBON-FILMS OBTAINED BY REACTIVEDIRECT-CURRENT MAGNETRON SPUTTERING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(1), 1996, pp. 194-196
Citations number
19
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
14
Issue
1
Year of publication
1996
Pages
194 - 196
Database
ISI
SICI code
0734-2101(1996)14:1<194:SOHCOB>2.0.ZU;2-C
Abstract
Amorphous hydrogenated carbon films were prepared by reactive direct c urrent magnetron sputtering in argon plasma containing methane as the reactant gas. The films were characterized using various spectroscopic measurements such as Raman scattering, optical absorption spectroscop y in the ultraviolet-visible region, and infrared (IR) absorption spec troscopy. The spectral analyses indicated that changes in Raman spectr oscopy intensity occurring with increasing methane gas content were de termined to be caused by changes in optically resonant components in t he films. Furthermore, a significant correlation was seen between the relative intensity of IR peaks and wear durability. (C) 1996 American Vacuum Society.