H. Furukawa et al., A NOVEL GAAS POWER MESFET WITH LOW DISTORTION CHARACTERISTICS EMPLOYING SEMIINSULATING SETBACK LAYER UNDER THE GATE, I.E.E.E. transactions on electron devices, 43(2), 1996, pp. 193-200
A low distortion GaAs power MESFET has been developed by employing a s
emi-insulating setback layer under the gate, The setback region was ob
tained by diffusing chromium from the Cr/Pt/Au gate metal in self-alig
ned manner. The novel power FET with the setback layer was found to be
insensitive to surface trapping effects, They showed only 5-6 percent
's frequency dispersion of drain current at 1 MHz compared to DC condi
tion. Because of this small frequency dispersion, the typical measurem
ent FET, which has the surface setback layer, with the gate width of 3
6 mm exhibited 1.5 dB larger output power at 1 dB gain compression poi
nt than that of the FET without the setback layer, Moreover, in the pi
/4 shift-QPSK modulation that has been most popular in digital mobile
communication system, the FET exhibited 11 dB smaller adjacent channel
leakage power than the conventional one at the output power of 31.5 d
Bm.