THERMAL IMPEDANCE EXTRACTION FOR BIPOLAR-TRANSISTORS

Authors
ZWEIDINGER DT FOX RM BRODSKY JS JUNG T LEE SG
Citation
Dt. Zweidinger et al., THERMAL IMPEDANCE EXTRACTION FOR BIPOLAR-TRANSISTORS, I.E.E.E. transactions on electron devices, 43(2), 1996, pp. 342-346
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
I.E.E.E. transactions on electron devices → ACNP
ISSN journal
00189383
Volume
43
Issue
2
Year of publication
1996
Pages
342 - 346
Database
ISI
SICI code
0018-9383(1996)43:2<342:TIEFB>2.0.ZU;2-X
Abstract
This paper describes a method for extracting the thermal impedance of bipolar transistors, The measurement is a two-step process: first the fractional temperature coefficients are calibrated at de and then a tr ansient step response is measured to extract the thermal spreading imp edance. Measurement configurations and an example measurement cycle ar e shown, The measurement results can be fitted to multiple-pole models for use in compact circuit modeling in SPICE.