The Ge1-yCy semiconductor alloy system offers promise as a material fo
r use in heterostructure devices based on Si as well as other material
s. We have grown Ge1-yCy alloys by solid source molecular beam epitaxy
on Si substrates. Layer thicknesses ranged from 0.01 to 3 mu m, and A
uger electron spectroscopy and secondary ion mass spectrometry indicat
ed C fractions up to 3 at. %. Optical absorption in the near-infrared
region indicated a shift in the energy bandgap from that of Ge which w
as attributed to the effects of alloying. The dependence of the bandga
p on composition was consistent with linear interpolations of the Ge a
nd C conduction band minimums. We observed a fundamental absorption ed
ge characteristic of an indirect bandgap material. Photoluminescence s
pectra at 11K of thick, relaxed layers indicated single broad peaks ne
ar the expected bandgap energy.