Xr. Jiang et P. Kruit, COMPARISON BETWEEN DIFFERENT IMAGING MODES IN FOCUSED ION-BEAM INSTRUMENTS, Microelectronic engineering, 30(1-4), 1996, pp. 249-252
In a two-lens focussed ion beam instrument, one can choose to either h
ave a crossover in between the lenses or not. For a representative ins
trument, it is shown that the optimized probe size of the non-crossove
r mode is smaller than that of the crossover mode. Both the lens aberr
ations and the statistical Coulomb effects are responsible for this ef
fect. We analyzed the differences for a large range of beam currents a
nd found that in the absence of statistical Coulomb interactions, the
difference can be as much as a factor 1.6. In the presence of Coulomb
interactions, the difference increases to a factor 1.8.