COMPARISON BETWEEN DIFFERENT IMAGING MODES IN FOCUSED ION-BEAM INSTRUMENTS

Authors
Citation
Xr. Jiang et P. Kruit, COMPARISON BETWEEN DIFFERENT IMAGING MODES IN FOCUSED ION-BEAM INSTRUMENTS, Microelectronic engineering, 30(1-4), 1996, pp. 249-252
Citations number
11
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
30
Issue
1-4
Year of publication
1996
Pages
249 - 252
Database
ISI
SICI code
0167-9317(1996)30:1-4<249:CBDIMI>2.0.ZU;2-E
Abstract
In a two-lens focussed ion beam instrument, one can choose to either h ave a crossover in between the lenses or not. For a representative ins trument, it is shown that the optimized probe size of the non-crossove r mode is smaller than that of the crossover mode. Both the lens aberr ations and the statistical Coulomb effects are responsible for this ef fect. We analyzed the differences for a large range of beam currents a nd found that in the absence of statistical Coulomb interactions, the difference can be as much as a factor 1.6. In the presence of Coulomb interactions, the difference increases to a factor 1.8.