ULTRA SHARP CRYSTALLINE SILICON TIP ARRAY USED AS FIELD EMITTER

Citation
W. Mehr et al., ULTRA SHARP CRYSTALLINE SILICON TIP ARRAY USED AS FIELD EMITTER, Microelectronic engineering, 30(1-4), 1996, pp. 395-398
Citations number
4
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
30
Issue
1-4
Year of publication
1996
Pages
395 - 398
Database
ISI
SICI code
0167-9317(1996)30:1-4<395:USCSTA>2.0.ZU;2-W
Abstract
This article describes the fabrication of single crystal silicon field emission tip arrays. Each array consists of 2500 tips. We used 4 in. (100) oriented n type silicon wafers 0.008 - 0.020 Omega cm, Sb doped. The tips were formed using a RIE process. We achieved crystalline emi tter tip radiuses of 1.5 - 2 nm. The extraction yid is a self aligned, sputter deposited Ti-0.1 W-0.9 film. The radiuses of the extraction g rid apertures range from 300 to 150 nm and have a tip to tip spacing f rom 10 to 5 mu m. The testing was done in vacuum with a distance of 50 0 mu m between extraction grid and anode. We have seen maximum stable array currents up to 2 mu A An anode current of 10 nA was initially de tected at minimal gate bias of about 14 V.