TRANSIENT CURRENT DURING SWITCHING IN INCREASING ELECTRIC-FIELD AS A BASIS FOR A NEW TESTING METHOD

Citation
Vy. Shur et al., TRANSIENT CURRENT DURING SWITCHING IN INCREASING ELECTRIC-FIELD AS A BASIS FOR A NEW TESTING METHOD, Integrated ferroelectrics, 10(1-4), 1995, pp. 223-230
Citations number
20
Categorie Soggetti
Physics, Condensed Matter","Engineering, Eletrical & Electronic","Physics, Applied
Journal title
ISSN journal
10584587
Volume
10
Issue
1-4
Year of publication
1995
Pages
223 - 230
Database
ISI
SICI code
1058-4587(1995)10:1-4<223:TCDSII>2.0.ZU;2-I
Abstract
The paper presents the new method of detail analyzing of transient cur rent data in linear increasing electric field, which allows to obtain the time dependence of main parameters characterizing the domain kinet ics, The switching process in PZT thin films, so as in Pb5Ge3O11 model single crystal was investigated.