APPLICATIONS OF AN ATOMIC-FORCE MICROSCOPE VOLTAGE PROBE WITH ULTRAFAST TIME RESOLUTION

Authors
NECHAY BA HO F HOU AS BLOOM DM
Citation
Ba. Nechay et al., APPLICATIONS OF AN ATOMIC-FORCE MICROSCOPE VOLTAGE PROBE WITH ULTRAFAST TIME RESOLUTION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1369-1374
Citations number
13
Journal title
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena → ACNP
ISSN journal
10711023
Volume
13
Issue
3
Year of publication
1995
Pages
1369 - 1374
Database
ISI
SICI code
1071-1023(1995)13:3<1369:AOAAMV>2.0.ZU;2-Q