A technique for modeling the electrical conductivity of ionic melts vi
a molecular dynamics simulations was used to study ionic transport in
an electric field at 2000 K for CaO-SiO2 oxides with 0, 33.3, 50, 66.7
, 80, and 100 mol % CaO. The model system included about 500 ions in a
cubic box with periodic boundary conditions. Coulomb interactions wer
e evaluated by the Ewald-Ansen method. For melts with kappa>50 S/m, th
e calculated conductivity agrees well with experimental data. In a wea
k electric field, silicon ions are entrained by surrounding oxygen ion
s and make a negative contribution to conductivity. This result is in
line with the opinion that silicates contain fairly stable complex ion
s SiO44-.