STRUCTURE AND OPTICAL-PROPERTIES OF CA3GA2GE4O14 THIN-FILMS

Authors
LESHCHUK RE NOSENKO AE GRYTSIV MY CHYKHRII SI
Citation
Re. Leshchuk et al., STRUCTURE AND OPTICAL-PROPERTIES OF CA3GA2GE4O14 THIN-FILMS, Inorganic materials, 32(2), 1996, pp. 204-206
Citations number
11
Categorie Soggetti
Material Science
Journal title
Inorganic materials → ACNP
ISSN journal
00201685
Volume
32
Issue
2
Year of publication
1996
Pages
204 - 206
Database
ISI
SICI code
0020-1685(1996)32:2<204:SAOOCT>2.0.ZU;2-V
Abstract
Ca3Ga2Ge4O14 thin films were prepared for the first time by rf sputter ing. X-ray diffraction studies showed that the as-deposited films were amorphous; crystallization began at 750 degrees C; annealing at 800 d egrees C yielded polycrystalline trigonal Ca-gallogermanate. We studie d changes in the optical properties of Ca3Ga2Ge4O14 films during struc tural transformations. Our results demonstrate that rf sputtering can be successfully used to prepare thin films of Ca-gallogermanates.