I. Aller et Hl. Hartnagel, SELECTIVE-AREA GROWTH OF INP BY PLASMA-ASSISTED SOLID-SOURCE EPITAXY, Journal of electronic materials, 25(3), 1996, pp. 421-424
Complete selective area growth of InP could be achieved at standard mo
lecular beam epitaxial growth temperatures by using solid source epita
xy with an additional hydrogen rf-plasma (27 MHz) excited in the react
ion chamber. By optimization of the process parameters such as substra
te temperature, plasma power, and phosphorus overpressure, mirror-like
InP-layers with geometry independent growth rates were grown on SiN-p
atterned InP substrates without polycrystalline growth on the mask. Si
nce selective growth is also possible in an argon plasma, we conclude
that a physical desorption process is the mechanism for selective area
growth in this plasma assisted epitaxy method. Furthermore, the selec
tivity can be controlled by a de-bias of the substrate, which influenc
es the mean energy of the impinging ions, thereby changing the desorpt
ion rate of atoms from the mask.