LOW-DIELECTRIC COMPOSITIONS WITH CONTROLLED CRYSTALLIZATION AND THERMAL-EXPANSION

Citation
Jh. Jean et al., LOW-DIELECTRIC COMPOSITIONS WITH CONTROLLED CRYSTALLIZATION AND THERMAL-EXPANSION, Materials chemistry and physics, 43(1), 1996, pp. 31-37
Citations number
10
Categorie Soggetti
Material Science
ISSN journal
02540584
Volume
43
Issue
1
Year of publication
1996
Pages
31 - 37
Database
ISI
SICI code
0254-0584(1996)43:1<31:LCWCCA>2.0.ZU;2-S
Abstract
Cristobalite is formed in an initially amorphous low-dielectric lead b orosilicate glass at 700-900 degrees C. With added alumina content gre ater than a critical value, however, the cristobalite formation in the lead borosilicate glass is completely inhibited. The critical alumina content is found to decrease with decreasing alumina particle size bu t with increasing sintering temperature. This result is attributed to a strong coupling reaction between Al3+ from alumina and Na+ and Pb2from lead borosilicate glass. The resulting cristobalite-free glass co mposite has a dielectric constant of 5.0 at 1 MHz and a thermal expans ion coefficient of (2.5 - 4.0) x 10(-6) K-1 in the temperature range o f 25-200 degrees C.