APPLICATION OF THE IONLESS TRIPOD POLISHER TO THE PREPARATION OF YBCOSUPERCONDUCTING MULTILAYER AND BULK CERAMICS THIN-FILMS

The standard method of polishing using ion milling for cross-section p reparation induces atomic diffusion which can be avoided by using an i onless polisher. The present paper gives the details of the method as applied to superconducting YBa2Cu3O7 melt-textured ceramics and multil ayer thin films. The structure and chemistry of interfaces in this com plex system are known to be influenced by changes in the chemical comp osition, Because of non-stoichiometry related growth of secondary phas es, many secondary phases form. We present a technique, which allows p reparation of electron-transparent TEM samples, that can be used for H REM and chemical characterizations.