TESTABILITY IMPROVEMENTS USING E-BEAM CONTROLLABILITY - PRINCIPLE ANDDESIGN FOR ELECTRON-BEAM TESTABILITY

Authors
LANDRAULT C NOUET P
Citation
C. Landrault et P. Nouet, TESTABILITY IMPROVEMENTS USING E-BEAM CONTROLLABILITY - PRINCIPLE ANDDESIGN FOR ELECTRON-BEAM TESTABILITY, Microelectronic engineering, 31(1-4), 1996, pp. 47-54
Citations number
13
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
31
Issue
1-4
Year of publication
1996
Pages
47 - 54
Database
ISI
SICI code
0167-9317(1996)31:1-4<47:TIUEC->2.0.ZU;2-8
Abstract
A new concept for Electron-Beam Testing of Integrated Circuit (IC) is presented. The procedure involves E-Beam logical controllability and o bservability in order to apply test patterns and to analyze circuit re sponse directly on the I/O of an embedded functional block. Simple and low silicon cost design for testability rules are given.