IMAGING OF THERMAL-PROPERTIES AND TOPOGRAPHY BY COMBINED SCANNING THERMAL AND SCANNING-TUNNELING-MICROSCOPY

Authors
OESTERSCHULZE E STOPKA M
Citation
E. Oesterschulze et M. Stopka, IMAGING OF THERMAL-PROPERTIES AND TOPOGRAPHY BY COMBINED SCANNING THERMAL AND SCANNING-TUNNELING-MICROSCOPY, Microelectronic engineering, 31(1-4), 1996, pp. 241-248
Citations number
10
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
31
Issue
1-4
Year of publication
1996
Pages
241 - 248
Database
ISI
SICI code
0167-9317(1996)31:1-4<241:IOTATB>2.0.ZU;2-Z