SI SIGE HBTS FOR APPLICATION IN LOW-POWER ICS

Citation
D. Behammer et al., SI SIGE HBTS FOR APPLICATION IN LOW-POWER ICS, Solid-state electronics, 39(4), 1996, pp. 471-480
Citations number
25
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
39
Issue
4
Year of publication
1996
Pages
471 - 480
Database
ISI
SICI code
0038-1101(1996)39:4<471:SSHFAI>2.0.ZU;2-P
Abstract
Broad-band and wireless communication seem to be a technology battlegr ound, with new high performance demands to the applied active and pass ive devices, and the optimization of circuit design. Up to now, there are several technologies for low power and low noise or high speed app lications, e.g. the advanced silicon bipolar transistor, III-V HBTs, H EMTs, and MODFETs. In this paper, the advantage of Si/SiGe HBTs are pr esented and discussed with a view to their fabrication in a low-cost m ass production technology. For further increasing the performance of t he Si/SiGe HBT, the vertical doping profile and the lateral structure need to be optimized. Utilizing new low temperature ultra-scaled fully self-aligned integration concepts, a Si heterojunction bipolar device can be achieved featuring high package density, good passivation and long term stability.