In this paper PP--type junction termination is investigated. Based on
2D simulations, we have optimized this termination in the 1200-1400 V
range under non-punch-through (NPT) and in the 400-600 V range under p
unch-through (PT) conditions. We have analysed the influence of the do
ping and the length of the lowly-doped P- region on the efficiency of
the termination and the influence of charges in the field oxide. These
simulation results were then validated using test devices.