1 F NOISE OF GAAS RESISTORS ON SEMIINSULATING SUBSTRATES/

Citation
L. Forbes et al., 1 F NOISE OF GAAS RESISTORS ON SEMIINSULATING SUBSTRATES/, I.E.E.E. transactions on electron devices, 43(4), 1996, pp. 622-627
Citations number
27
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189383
Volume
43
Issue
4
Year of publication
1996
Pages
622 - 627
Database
ISI
SICI code
0018-9383(1996)43:4<622:1FNOGR>2.0.ZU;2-R
Abstract
A new theory is used to analyze the 1/f noise of GaAs resistors on sem i-insulating substrates. It is demonstrated that this model can explai n previously published results at moderately high frequencies for, in this example, resistive filaments on semi-insulating GaAs substrates, The model is based on a distributed equivalent circuit representation of the substrate, and shows that 1/f noise a bulk phenomena associated with the high resistivity substrates, The 1/f noise is not associated with number or mobility fluctuations in the channel, nor surface effe cts, One consequence of the theory is that in this particular instance Hooge's parameter is in reality no parameter but is given by a simple formula which has a simple physical interpretation as the ratio of tw o charges; the thermal charge developed across the substrate capacitan ce and the charge associated with ionized donors in the resistor chann el.