CONTROL OF SUBSTRATE-TEMPERATURE DURING DIAMOND DEPOSITION

Citation
Mt. Bieberich et Sl. Girshick, CONTROL OF SUBSTRATE-TEMPERATURE DURING DIAMOND DEPOSITION, Plasma chemistry and plasma processing, 16(1), 1996, pp. 157-168
Citations number
15
Categorie Soggetti
Physics, Applied","Engineering, Chemical","Phsycs, Fluid & Plasmas
ISSN journal
02724324
Volume
16
Issue
1
Year of publication
1996
Supplement
S
Pages
157 - 168
Database
ISI
SICI code
0272-4324(1996)16:1<157:COSDDD>2.0.ZU;2-Q
Abstract
A method is reported for controlling substrate temperature during chem ical vapor deposition of diamond in high heat flux environments such a s thermal plasmas or flames. The method is based on flowing a variable -composition argon-helium mixture through channels between the substra te and a water-cooled base. A fiberoptic pyrometer temperature reading from the back of the substrate provides feedback for active substrate temperature control. Experiments in an atmospheric-pressure RF reacto r under diamond growth conditions indicated that substrate temperature could be sensitively varied by over 600 K by varying the composition of the argon-helium mixture. The effect is explained in terms of the v ariable thermal contact resistance at the interface between the substr ate and the base.