Ca. Wang et al., LOW-OXYGEN AND CARBON INCORPORATION IN ALGAAS USING TRITERTIARYBUTYLALUMINUM IN ORGANOMETALLIC VAPOR-PHASE EPITAXY, Journal of electronic materials, 25(4), 1996, pp. 771-774
High-quality AlGaAs epilayers have been grown by low pressure organome
tallic vapor phase epitaxy with a new aluminum precursor tritertiarybu
tylaluminum (TTBAl). Layers grown at 650 degrees C have a featureless
mirror surface morphology and strong room temperature photoluminescenc
e. Carbon was not detectable in chemical analysis by secondary ion mas
s spectroscopy, nor in low temperature (4K) photoluminescence spectra.
Oxygen concentration in Al0.25Ga0.75As is as low as similar to 2-3 x
10(17) cm(-3). Nominally undoped AlGaAs layers exhibit n-type conducti
vity with electron concentrations at similar to 1-1.5 x 10(16) cm(-3).
A high degree of compositional uniformity over 5 cm diam substrates (
0.268 +/- 0.001) was obtained. These results indicate the potential fo
r TTBAl as an aluminum precursor for low temperature growth of Al-cont
aining III-V alloys.