Laser device lifetime is linked to electrical dissipation, hence verti
cal transport. One significant issue is the resistivity of ZnSe and al
loys of ZnSe. The results of our recent studies into the origins of bo
th doping level limitations in ZnSe, and the relatively high acceptor
activation energies found in wide bandgap alloys of ZnSe, will be revi
ewed. The experimental evidence, including the presence or absence of
persistent photoconductivity in wide bandgap alloys of p-ZnSe and p-Zn
Se:N, points to the presence of deep levels associated with lattice re
laxation as the origin of the increased acceptor activation energy. Ke
y issues of growth include the evaluation of sticking coefficient for
the alloy constituents, and the maintenance of constant substrate temp
erature to avoid variations in alloy fraction, The appearance of compo
sition modulation in ZnSe alloys will also be discussed. Understanding
the degradation of II-VI blue-green laser diodes has become important
after the demonstrations of room-temperature continuous-wave operatio
n from (Zn,Mg)(S,Se)/Zn(S,Se)/(Zn,Cd)Se separate confinement heterostr
ucture (SCH) laser diodes. The observed degradation seems associated w
ith the existence of stacking faults originated from the II-VI/GaAs he
terovalent interfaces. Segments of these extended structural defects w
hich penetrate the active region become sources for the generation of
macroscopically dark patches under lasing conditions. Lessons from III
-V semiconductor laser device research are consistent with the observa
tion that the presence of non-radiative point defects and built-in str
ain contribute to the propagation and growth of dislocations. Efforts
to reduce the density of stacking faults continue, while the temperatu
re dependence of photoluminescence points the way to a reduction in as
-grown point defects.