ZnxCd1-xS alloy layers revealing the wurtzite modification have been s
uccessfully grown by molecular beam epitaxy for the first time. The he
xagonal crystal structure is achieved by using a wurtzite CdS buffer l
ayer deposited by hot-wall beam epitaxy on a GaAs((1) over bar (1) ove
r bar (1) over bar)B substrate. Characterization of the alloy films in
cludes in situ RHEED investigations, X-ray diffraction and optical mea
surements, TEM diffraction patterns and reflection spectra are used to
confirm the ZnxCd1-xS alloys to be of the wurtzite type. Photolumines
cence is dominated by localized exciton emission. For layers with high
Zn content (x > 0.4), film quality decreases due to the increased mis
match to the CdS buffer and the fact, that the stable bulk phase for Z
n-rich alloys is cubic.