Quarter wavelength distributed Bragg reflectors (DBRs) of MnZnSSe/ZnSS
e (referred to as Mn-DBR) and MgZnSSe/ZnSSe (Mg-DBR) have been grown b
y molecular beam epitaxy for the blue-green spectral region, In partic
ular, a continuous in situ optical reflectance monitoring was employed
to control the layer thickness of Mg-DBR. This growth monitoring tech
nique appeared to be simple, low cost, accurate and extremely useful w
hen preparing complex epitaxial layers which otherwise would require s
table growth conditions for long time periods, The Mn-DBR consisted of
a 25-pair stack of MnZnSSe and ZnSSe layers with the periodicity of 8
4.5 nm. The Mg-DBR consisted of a 20-pair stack of MgZnSSe and ZnSSe l
ayers with a periodicity of 93.3 nm. All the structures were lattice-m
atched to GaAs substrates. The Mn-DBR exhibited maximum reflectance of
81% centred at 486 nm at room temperature, while the Mg-DBR had maxim
um reflectance of 86% at 473 nm, Experimental X-ray diffraction rockin
g curves and computer simulated rocking curves for both the samples ex
hibited sharp features in good agreement with each other and provided
evidence that the constituent layers had grown coherently strained thr
oughout the entire DBR structures.