STRUCTURAL-PROPERTIES OF ZNSE GAAS(100) HETEROSTRUCTURES WITH ENGINEERED BAND OFFSETS/

Citation
G. Bratina et al., STRUCTURAL-PROPERTIES OF ZNSE GAAS(100) HETEROSTRUCTURES WITH ENGINEERED BAND OFFSETS/, Journal of crystal growth, 159(1-4), 1996, pp. 703-708
Citations number
11
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
159
Issue
1-4
Year of publication
1996
Pages
703 - 708
Database
ISI
SICI code
0022-0248(1996)159:1-4<703:SOZGHW>2.0.ZU;2-H
Abstract
The band discontinuities in ZnSe-GaAs(100) heterostructures grown by m olecular beam epitaxy depend on the local interface composition, We us ed a thin (20 Angstrom thick) composition control layer fabricated at the interface in Zn-rich or Se-rich conditions to control the band off sets for heterostructures in which the bulk of the II-VI epilayer was fabricated in stoichiometric growth conditions. Here we focus on the r esulting variations in atomic interdiffusion across the interface, and on the local and long-range structural properties of the II-VI epilay er.