SHORT-RANGE ORDER AND MICRO-INHOMOGENEITIES IN CDXHG1-XTE - CHARACTERIZATION BY MEANS OF FIR AND RAMAN SPECTROSCOPIES

We used a combination of FIR normal incidence reflectivity and Raman s cattering spectroscopies to study the effects of short-range order and alloy micro-inhomogeneities in CdxHg1-xTe samples of different compos ition grown by three different techniques. Only spectra of SSR-grown s amples contained a sign of the extra mode near 135 cm(-1) attributed t o short-range ordering, Using three different models, we calculated an effective dielectric response of the CdxHg1-xTe containing micro-inho mogeneities. A composite-like system of interpenetrating regions of su bstantially different electron concentration seems to be the relevant model of PEMOCVD-grown n-type epilayers.