SCANNING NEAR-FIELD OPTICAL MICROSCOPY SPECTROSCOPY OF THIN ORGANIC FILMS/

Citation
La. Nagahara et H. Tokumoto, SCANNING NEAR-FIELD OPTICAL MICROSCOPY SPECTROSCOPY OF THIN ORGANIC FILMS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 800-803
Citations number
22
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
14
Issue
2
Year of publication
1996
Pages
800 - 803
Database
ISI
SICI code
1071-1023(1996)14:2<800:SNOMSO>2.0.ZU;2-G
Abstract
We have used a scanning near-field optical microscope to investigate t he optical properties of a thin organic film consisting of poly(phenyl ene vinylene) and tris(8-hydroxy)quinoline aluminum. Near-field optica l images taken in transmission mode using a 488 nm laser light reveale d numerous ''dark spots'' scattered randomly across the filmy however, the dark spots were not related to the surface topography. These dark spots ranged in size from 100-300 nm in diameter. The nature of the d ark spots was attributed to an increase in the absorption at 488 nm as a result of local variations in the poly(phenylene vinylene) film. (C ) 1996 American Vacuum Society.