La. Nagahara et H. Tokumoto, SCANNING NEAR-FIELD OPTICAL MICROSCOPY SPECTROSCOPY OF THIN ORGANIC FILMS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 800-803
We have used a scanning near-field optical microscope to investigate t
he optical properties of a thin organic film consisting of poly(phenyl
ene vinylene) and tris(8-hydroxy)quinoline aluminum. Near-field optica
l images taken in transmission mode using a 488 nm laser light reveale
d numerous ''dark spots'' scattered randomly across the filmy however,
the dark spots were not related to the surface topography. These dark
spots ranged in size from 100-300 nm in diameter. The nature of the d
ark spots was attributed to an increase in the absorption at 488 nm as
a result of local variations in the poly(phenylene vinylene) film. (C
) 1996 American Vacuum Society.